JULIANNE M. THORNE; ALISTAIR K. STERLING; ELENA R. VANCE. A Deep Learning-Based Approach for Fault Detection in Smart Manufacturing Environments. Computer Science and Engineering Transactions, [S. l.], v. 1, n. 1, 2026. DOI: 10.66280/cset.v1i1.88. Disponível em: https://scivexus.org/index.php/cset/article/view/88. Acesso em: 7 apr. 2026.